Testing RRAM and Computation-in-Memory Devices: Defects, Fault Models, and Test Solutions

Resistive random access memory (RRAM) is a promising emerging memory technology that offers dense, non-volatile memories that do not consume any static power. Furthermore, RRAMdevices can be written and read out in nanoseconds, and it is possible to use them to performcomputation-in-memory (CIM). These benefits make this technology a potential...

Defects, Fault Modeling, and Test Development Framework for RRAMs

Resistive RAM (RRAM) is a promising technology to replace traditional technologies such as Flash, because of its low energy consumption, CMOS compatibility, and high density. Many companies are prototyping this technology to validate its potential. Bringing this technology to the market requires high-quality tests to ensure customer...