A BJT-Based Temperature-to-Digital Converter With a 0.25 C 3 $\sigma$ -Inaccuracy From-40 C to 180 C Using Heater-Assisted Voltage Calibration

This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the...

An On-Chip Self-Characterization of a Digital-to-Time Converter by Embedding it in a First-Order ΔΣ Loop

To characterize an on-chip programmable delay in a low-cost and high-resolution manner, a built-in self-test based on a first-order ΔΣ time-to-digital converter with self-calibration is proposed and implemented in TSMC 28-nm CMOS. The system is self-contained, and only one digital clock is needed for the measurements. A...