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Aziza, H. (author), Postel-Pellerin, J. (author), Fieback, M. (author), Hamdioui, S. (author), Xun, H. (author), Taouil, M. (author), Coulie, K. (author), Rahajandraibe, W. (author)While Resistive RRAM (RRAM) offers attractive features for artificial neural networks (NN) such as low power operation and high-density, its conductance variation can pose significant challenges when the storage of synaptic weights is concerned. This paper reports an experimental evaluation of the conductance variations of manufactured RRAMs...conference paper 2024
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Pouyan, P. (author), Amat, Esteve (author), Hamdioui, S. (author), Rubio, Antonio (author)Emerging technologies such as RRAMs are attracting significant attention, due to their tempting characteristics such as high scalability, CMOS compatibility and non-volatility to replace the current conventional memories. However, critical causes of hardware reliability failures (such as process variation due to their nano-scale structure) have...conference paper 2016