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Picek, S. (author), Heuser, Annelie (author), Jovic, Alan (author), Batina, Lejla (author)Profiled side-channel attacks consist of several steps one needs to take. An important, but sometimes ignored, step is a selection of the points of interest (features) within side-channel measurement traces. A large majority of the related works start the analyses with an assumption that the features are preselected. Contrary to this...journal article 2019