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Abu Lebdeh, M.F.M. (author), Reinsalu, Uljana (author), Du Nguyen, H.A. (author), Wong, J.S.S.M. (author), Hamdioui, S. (author)
Emerging computing applications (such as big-data and Internet-of-things) are extremely demanding in terms of storage, energy and computational efficiency, while today’s architectures and device technologies are facing major challenges making them incapable to meet these demands. Computation-in-Memory (CIM) architecture based on memristive...
conference paper 2019
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Yu, J. (author), Du Nguyen, H.A. (author), Abu Lebdeh, M.F.M. (author), Taouil, M. (author), Hamdioui, S. (author)
Automata Processor (AP) is a special implementation of non-deterministic finite automata that performs pattern matching by exploring parallel state transitions. The implementation typically contains a hierarchical switching network, causing long latency. This paper proposes a methodology to split such a hierarchical switching network into...
conference paper 2019
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Condia, Josie E.Rodriguez (author), Augusto da Silva, F. (author), Hamdioui, S. (author), Sauer, C. (author), Reorda, M. Sonza (author)
Nowadays, General Purpose Graphics Processing Units (GPGPUs) devices are considered as promising solutions for high-performance safety-critical applications, such as those in the automotive field. However, their adoption requires solutions to effectively detect faults arising in the device during the operative life. Hence, effective in-field...
conference paper 2019
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Cardoso Medeiros, G. (author), Taouil, M. (author), Fieback, M. (author), Bolzani Poehls, L. M. (author), Hamdioui, S. (author)
Hard-to-detect faults such as weak and random faults in FinFET SRAMs represent an important challenge for manufacturing testing in scaled technologies, as they may lead to test escapes. This paper proposes a Design-for-Testability (DFT) scheme able to detect such faults by monitoring the bitline swing of FinFET memories. Using only five...
conference paper 2019
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Hamdioui, S. (author), Du Nguyen, H.A. (author), Taouil, M. (author), Sebastian, Abu (author), Le Gallo, Manuel (author), Pande, Sandeep (author), Schaafsma, Siebren (author), Catthoor, Francky (author), Das, Shidhartha (author), G. Redondo, Fernando (author), Karunaratne, G. (author), Rahimi, Abbas (author), Benini, Luca (author)
Today's computing architectures and device technologies are unable to meet the increasingly stringent demands on energy and performance posed by emerging applications. Therefore, alternative computing architectures are being explored that leverage novel post-CMOS device technologies. One of these is a Computation-in-Memory architecture based on...
conference paper 2019
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Kraak, D.H.P. (author), Gürsoy, C.C. (author), Agbo, I.O. (author), Taouil, M. (author), Jenihhin, M. (author), Raik, J. (author), Hamdioui, S. (author)
Integrated circuits typically contain design margins to compensate for aging. As aging impact increases with technology scaling, bigger margins are necessary to achieve the desired reliability. However, these increased margins lead to a reduced performance and lower yield. Alternatively, mitigation schemes can be deployed to reduce the aging....
conference paper 2019
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Kraak, D.H.P. (author), Agbo, I.O. (author), Taouil, M. (author), Hamdioui, S. (author), Weckx, Pieter (author), Cosemans, Stefan (author), Catthoor, Francky (author)
Designers typically add design margins to memories to compensate for their aging. As the aging impact increases with technology scaling, bigger margins become necessary. However, this negatively impacts area, yield, performance, and power consumption. Alternatively, mitigation schemes can be used to reduce the impact of aging. This paper...
conference paper 2019
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Augusto da Silva, F. (author), Bagbaba, Ahmet Cagri (author), Hamdioui, S. (author), Sauer, Christian (author)
This work aims at an alternative method to verify the correctness of Fault Lists generated by fault simulators tools in context of safety verification. The lists generated by simulation tools are verified against lists from formal tools. The consistency evaluation between the lists supports the Tool Confidence Level (TCL) assessment, defined in...
conference paper 2018
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Yu, J. (author), Du Nguyen, H.A. (author), Xie, L. (author), Taouil, M. (author), Hamdioui, S. (author)
CMOS technology and its continuous scaling have made electronics and computers accessible and affordable for almost everyone on the globe; in addition, they have enabled the solutions of a wide range of societal problems and applications. Today, however, both the technology and the computer architectures are facing severe challenges/walls making...
conference paper 2018
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Pouyan, P. (author), Amat, Esteve (author), Hamdioui, S. (author), Rubio, Antonio (author)
Emerging technologies such as RRAMs are attracting significant attention, due to their tempting characteristics such as high scalability, CMOS compatibility and non-volatility to replace the current conventional memories. However, critical causes of hardware reliability failures (such as process variation due to their nano-scale structure) have...
conference paper 2016
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Haron, M.A.B. (author), Yu, J. (author), Nane, R. (author), Taouil, M. (author), Hamdioui, S. (author), Bertels, K.L.M. (author)
One of the most important constraints of today’s architectures for data-intensive applications is the limited bandwidth due to the memory-processor communication bottleneck. This significantly impacts performance and energy. For instance, the energy consumption share of communication and memory<br/>access may exceed 80%. Recently, the concept of...
conference paper 2016
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Yu, J. (author), Nane, R. (author), Haron, M.A.B. (author), Hamdioui, S. (author), Corporaal, H (author), Bertels, K.L.M. (author)
Memristor-based Computation-in-Memory is one of the emerging architectures proposed to deal with Big Data problems. The design of such architectures requires a radically new automatic design flow because the memristor is a passive device that uses resistance to encode its logic value. This paper proposes a design flow for mapping parallel...
conference paper 2016
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Hamdioui, S. (author), Al-Ars, Z. (author), Jimenez, J. (author), Calero, J. (author)
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests are industrially evaluated together with the traditional tests at "Design of Systems on Silicon (DS2)" in Spain in order to (a) validate the used fault models and (b)...
conference paper 2007
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