Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

We investigate the degradation of the magnetic moment of a 300?nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1??m?×?8??m rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the...

Beam induced deposition of platinum using a helium ion microscope

Helium ion microscopy is now a demonstrated practical technology that possesses the resolution and beam currents necessary to perform nanofabrication tasks, such as circuit edit applications. Due to helium’s electrical properties and sample interaction characteristics relative to gallium, it is likely that the properties and deposition...