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Wei, X. (author), Urbach, Paul (author), van der Walle, Peter (author), Coene, W.M.J.M. (author)We present a parameter retrieval method which incorporates prior knowledge about the object into ptychography. The proposed method is applied to two applications: (1) parameter retrieval of small particles from Fourier ptychographic dark field measurements; (2) parameter retrieval of a rectangular structure with real-space ptychography. The...journal article 2021