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Kabiri, Y. (author), Ananth, A.N. (author), van der Torre, J. (author), Katan, A.J. (author), Hong, Jin Yong (author), Malladi, S.R.K. (author), Kong, Jing (author), Zandbergen, H.W. (author), Dekker, C. (author)
While graphene may appear to be the ultimate support membrane for transmission electron microscopy (TEM) imaging of DNA nanostructures, very little is known if it poses an advantage over conventional carbon supports in terms of resolution and contrast. Microscopic investigations are carried out on DNA origami nanoplates that are supported...
journal article 2017
document
Storm, A.J. (author), Chen, J.H. (author), Ling, X.S. (author), Zandbergen, H.W. (author), Dekker, C. (author)
The imaging beam of a transmission electron microscope can be used to fine tune critical dimensions in silicon oxide nanostructures. This technique is particularly useful for the fabrication of nanopores with single-nanometer precision, down to 2 nm. We report a detailed study on the effect of electron-beam irradiation on apertures with various...
journal article 2005