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Lyu, T. (author), Dorenbos, P. (author)Guided by vacuum referred binding energy (VRBE) diagrams, both the trapping and detrapping processes of electrons and holes are explored in the bismuth and lanthanide-doped LiRE(Si,Ge)O<sub>4</sub> (RE = Y, Lu) family of compounds. The Tm<sup>3+</sup> electron trap has been combined with the deep hole traps of Ln<sup>3+</sup> (Ln = Ce, Tb, or...journal article 2020