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De Vreede, L. (author), Pelk, M.J. (author)Loss-compensating circuit for use when analysing electrical properties, such as largesignal properties, of an electronic device to be tested (1) by means of an impedance tuner (6; 7). The loss-compensating circuit (15) comprises two symmetrically positioned negative impedance elements (26, 27) separated by a phase shift network (17; 28; 30). By...patent 2004
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Larson, L.E. (author), De Vreede, L.C.N. (author)An integrated variable voltage diode capacitor topology applied to a circuit providing a variable voltage load for controlling variable capacitance. The topology includes a first pair of anti-series varactor diodes, wherein the diode power-law exponent n for the first pair of anti-series varactor diodes in the circuit is equal or greater than 0...patent 2006
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De Vreede, L.C.N. (author)Varactor element (Dl; D2) having a junction region, in which the depletion capacitance of the varactor element varies when a reverse bias voltage is applied to the varactor element. The varactor element (Dl; D2) has an exponential depletion capacitance- voltage relation, e.g. obtained by providing a predetermined doping profile in the junction...patent 2007
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Marchetti, M. (author), Pelk, M.J. (author), De Vreede, L.C.N. (author)Measurement arrangement and method for active load pull measurements of a device under test (1). A wideband analog-to-digital conversion block (3) is provided for obtaining measurement data. First and second injection signal generators (7, 8) are connected to a source side and a load side of the device under test (1). This set up allows to...patent 2009
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- Staszewski, R.B. (author), De Vreede, L.C.N. (author) patent 2011