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Moerland, R.J. (author), Hoogenboom, J.P. (author)Available data: Complex refractive index of Indium Tin Oxide, http://dx.doi.org/10.4121/uuid:59febf27-a532-4ac9-8ec0-29d4195b2c8c Transparent conductive oxides (TCOs), such as the well-known indium-tin oxide, find widespread use in modern (nano)technological applications because of their unique combination of negligible optical absorption and...journal article 2016
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Zhang, L. (author), Hoogenboom, J.P. (author), Cook, B.J. (author), Kruit, P. (author)Observing atomic motions as they occur is the dream goal of ultrafast electron microscopy (UEM). Great progress has been made so far thanks to the efforts of many scientists in developing the photoemission sources and beam blankers needed to create short pulses of electrons for the UEM experiments. While details on these setups have typically...journal article 2019
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Moerland, R.J. (author), Weppelman, I.G.C. (author), Garming, M.W.H. (author), Kruit, P. (author), Hoogenboom, J.P. (author)We show cathodoluminescence-based time-resolved electron beam spectroscopy in order to directly probe the spontaneous emission decay rate that is modified by the local density of states in a nanoscale environment. In contrast to dedicated laser-triggered electron-microscopy setups, we use commercial hardware in a standard SEM, which allows us to...journal article 2016
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Haring, M.T. (author), Liv Hamarat, N. (author), Zonnevylle, A.C. (author), Narvaez Gonzalez, A.C. (author), Voortman, L.M. (author), Kruit, P. (author), Hoogenboom, J.P. (author)In the biological sciences, data from fluorescence and electron microscopy is correlated to allow fluorescence biomolecule identification within the cellular ultrastructure and/or ultrastructural analysis following live-cell imaging. High-accuracy (sub-100 nm) image overlay requires the addition of fiducial markers, which makes overlay accuracy...journal article 2017
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Weppelman, I.G.C. (author), Moerland, R.J. (author), Zhang, L (author), Kieft, E. (author), Kruit, P. (author), Hoogenboom, J.P. (author)Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the source. We have recently presented the concept...journal article 2019