Searched for: +
(1 - 1 of 1)
document
Zhang, L. (author), Hoogenboom, J.P. (author), Cook, B.J. (author), Kruit, P. (author)
Observing atomic motions as they occur is the dream goal of ultrafast electron microscopy (UEM). Great progress has been made so far thanks to the efforts of many scientists in developing the photoemission sources and beam blankers needed to create short pulses of electrons for the UEM experiments. While details on these setups have typically...
journal article 2019