Du, L. (author), Deng, Shanliang (author), Cui, Z. (author), Poelma, René H. (author), Beelen-Hendrikx, Caroline (author), Zhang, Kouchi (author) In this study, we combined finite element method (FEM) based on Ansys and Noesis Optimus software to investigate the effect of bump structures and loading conditions on the electromigration properties of solder bumps in WLCSP. A numerical model considering current density, vacancy concentration, stress and temperature was utilized to calculate...
conference paper 2024
