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Kolenov, D. (author), Davidse, D. (author), Le Cam, J. (author), Pereira, S.F. (author)
The analysis of 2D scattering maps generated in scatterometry experiments for detection and classification of nanoparticles on surfaces is a cumbersome and slow process. Recently, deep learning techniques have been adopted to avoid manual feature extraction and classification in many research and application areas, including optics. In the...
journal article 2020