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van Driel, W.D. (author), Jacobs, B. (author), Watte, P. (author), Zhao, X. (author)
Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification...
journal article 2022
document
Guo, Y. (author), Zhao, Chunfa (author), Markine, V.L. (author), Jing, Guoqing (author), Zhai, Wanming (author)
The discrete element method (DEM) has been confirmed as an effective numerical method for modelling railway ballast, and successfully used to analyse a wide range of ballast-related applications (e.g. geomaterials). However, there still exists some aspects under development. Among them, the model calibration can be the most significant one ...
review 2020