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Van Der Sluis, Olaf (author), Iwamoto, Nancy (author), Qu, Jianmin (author), Yang, Shaorui (author), Yuan, C.A. (author), van Driel, W.D. (author), Zhang, Kouchi (author)
Adhesion and delamination have been pervasive problems hampering the performance and reliability of micro-and nano-electronic devices. In order to understand, predict, and ultimately prevent interface failure in electronic devices, development of accurate, robust, and efficient delamination testing and prediction methods is crucial. Adhesion...
book chapter 2018