System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method

The increased system complexity in electronic products brings challenges in a system level reliability assessment and lifetime estimation. Traditionally, the graph model-based reliability block diagrams (RBD) and fault tree analysis (FTA) have been used to assess the reliability of products and systems. However, these methods are based on...

Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light-Emitting Diodes

Light-emitting diodes (LEDs) are among the key innovations that have revolutionized the lighting industry, due to their versatility in applications, higher reliability, longer lifetime, and higher efficiency compared with other light sources. The demand for increased lifetime and higher reliability has attracted a significant number of...