Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

The manufacturing process of STT-MRAM requires unique steps to fabricate and integrate magnetic tunnel junction (MTJ) devices which are data-storing elements. Thus, understanding the defects in MTJs and their faulty behaviors are paramount for developing high-quality test solutions. This article applies the advanced device-aware test to...

Automated seismic acquisition geometry design for optimized illumination at the target: a linearized approach

In seismic exploration methods, imperfect spatial sampling at the surface causes a lack of illumination at the target in the subsurface. The hampered image quality at the target area of interest causes uncertainties in reservoir monitoring and production, which can have a substantial economic impact. Especially in the case of a complex...