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Lazar, S. (author), Hebert, C. (author), Zandbergen, H.W. (author)
journal article 2004
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Moreno, M.S. (author), Lazar, S. (author), Zandbergen, H.W. (author), Egerton, R.F. (author)
journal article 2006
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Moore, K.T. (author), Chung, B.W. (author), Morton, S.A. (author), Schwartz, A.J. (author), Tobin, J.G. (author), Lazar, S. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author), Söderlind, P. (author), van der Laan, G. (author)
journal article 2004
document
Lazar, S. (author), Weyher, J.L. (author), Macht, L. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author)
Photochemical (PEC) etching and transmission electron microscopy (TEM) have been used to study the defects in hetero-epitaxial GaN layers. TEM proved that PEC etching reveals not only dislocations but also nanopipes in the form of protruding, whisker-like etch features. It is shown by diffraction contrast techniques that the nanopipes are screw...
journal article 2004
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