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't Hart, P.A. (author), Huizinga, T. (author), Babaie, M. (author), Vladimirescu, A. (author), Sebastiano, F. (author)
This work presents an experimental study of different components (resistors, diodes, transistors) in a standard 40-nm bulk CMOS process for their suitability as integrated cryogenic temperature sensors down to a temperature of 4.2K. It was found that most devices can be employed as sensors down to temperatures of approximately 50K, below...
conference paper 2022