Kraak, D.H.P. (author), Gürsoy, C.C. (author), Agbo, I.O. (author), Taouil, M. (author), Jenihhin, M. (author), Raik, J. (author), Hamdioui, S. (author) Integrated circuits typically contain design margins to compensate for aging. As aging impact increases with technology scaling, bigger margins are necessary to achieve the desired reliability. However, these increased margins lead to a reduced performance and lower yield. Alternatively, mitigation schemes can be deployed to reduce the aging....
conference paper 2019
