Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker

Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the source. We have recently presented the concept...

Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductors

Available data: Complex refractive index of Indium Tin Oxide, http://dx.doi.org/10.4121/uuid:59febf27-a532-4ac9-8ec0-29d4195b2c8c Transparent conductive oxides (TCOs), such as the well-known indium-tin oxide, find widespread use in modern (nano)technological applications because of their unique combination of negligible optical absorption and...

Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states

We show cathodoluminescence-based time-resolved electron beam spectroscopy in order to directly probe the spontaneous emission decay rate that is modified by the local density of states in a nanoscale environment. In contrast to dedicated laser-triggered electron-microscopy setups, we use commercial hardware in a standard SEM, which allows us to...