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Karrer, Markus (author), Dias Neto, J. (author), von Terzi, Leonie (author), Kneifel, Stefan (author)
Comparing the reflectivity flux at the top and bottom of the melting layer (ML) reveals the overall effect of the microphysical processes occurring within the ML on the particle population. If melting is the only process taking place and all particles scatter in the Rayleigh regime, the reflectivity flux increases in the ML by a constant...
journal article 2022