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Martin, H.A. (author), Smits, Edsger C.P. (author), Poelma, René H. (author), van Driel, W.D. (author), Zhang, Kouchi (author)This article introduces an online condition monitoring strategy that utilizes a transient heat pulse to detect package thermal performance degradation. The metric employed is the temperature-dependent transient thermal impedance "Zth(t, Tamb)."The proposed methodology offers quantitative insights into package thermal performance degradation...journal article 2024
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Li, J. (author), Vollebregt, S. (author), Zhang, Y. (author), Shekhar, A. (author), May, Alexander (author), van Driel, W.D. (author), Zhang, Kouchi (author)Due to the deficient passivation of the interface between silicon carbide and silicon dioxide, the defect-induced capture and release of trapped charges triggered by external Bias Temperature Stress (BTS) leads to parameter shifts and degraded device performance. This study models the trap-induced transient current in silicon carbide metal-oxide...conference paper 2024
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Jacobs, B. (author), van Driel, W.D. (author), Schuld, M. (author)Commercial claims for LED-based products in terms of lumen maintenance are fully based on TM-21 extrapolations using LM-80 data. We presented an approach based on statistical data analytics, following the work from Yu & Tseng, at EuroSimE2015. Since then, more LM80 test data came available both for High Power (HP) and Mid Power (MP) LEDs....conference paper 2018