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Haring, M.T. (author), Liv Hamarat, N. (author), Zonnevylle, A.C. (author), Narvaez Gonzalez, A.C. (author), Voortman, L.M. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
In the biological sciences, data from fluorescence and electron microscopy is correlated to allow fluorescence biomolecule identification within the cellular ultrastructure and/or ultrastructural analysis following live-cell imaging. High-accuracy (sub-100 nm) image overlay requires the addition of fiducial markers, which makes overlay accuracy...
journal article 2017
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Zonnevylle, A.C. (author)
doctoral thesis 2017
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Narvaez, A.C. (author), Weppelman, I.G.C. (author), Moerland, R.J. (author), Liv, N. (author), Zonnevylle, A.C. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
Cathodoluminescence (CL) microscopy is an emerging analysis technique in the fields of biology and photonics, where it is used for the characterization of nanometer sized structures. For these applications, the use of transparent substrates might be highly preferred, but the detection of CL from nanostructures on glass is challenging because of...
journal article 2013
document
Hoogenboom, J.P. (author), Kruit, P. (author), Zonnevylle, A.C. (author)
The invention relates to an apparatus for inspecting a sample, equipped with a charged particle column for producing a focused beam of charged particles to observe or modify the sample, and an optical microscope to observe a region of interest on the sample as is observed by the charged particle beam or vice versa, the apparatus accommodated...
patent 2013
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Liv, N. (author), Zonnevylle, A.C. (author), Narvaez, A.C. (author), Effting, A.P.J. (author), Voorneveld, P.W. (author), Lucas, M.S. (author), Hardwick, J.C. (author), Wepf, R.A. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
Correlative light and electron microscopy (CLEM) is a unique method for investigating biological structure-function relations. With CLEM protein distributions visualized in fluorescence can be mapped onto the cellular ultrastructure measured with electron microscopy. Widespread application of correlative microscopy is hampered by elaborate...
journal article 2013
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Kruit, P. (author), Hoogenboom, J.P. (author), Zonnevylle, A.C. (author)
An inspection apparatus is provided comprising in combination at least an optical microscope and an ion- or electron microscope equipped with a source for emitting a primary beam of radiation to a sample in a sample holder. The apparatus may comprise a detector for detection of secondary radiation backscattered from the sample and induced by the...
patent 2012
document
Zonnevylle, A.C. (author), Hagen, C.W. (author), Kruit, P. (author), Valenti, M. (author), Schmidt-Ott, A. (author)
Positioning of charged nanoparticles with the help of charge patterns in an insulator substrate is a known method. However, the creation of charge patterns with a scanning electron microscope for this is relatively new. Here a scanning electron microscope is used for the creation of localized charge patterns in an insulator, while a glowing wire...
journal article 2009
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