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Alkemade, P.F.A. (author), Miro, H. (author), Van Veldhoven, E. (author), Maas, D.J. (author), Smith, D.A. (author), Rack, P.D. (author)The sub-nanometer beam of a helium ion microscope was used to study and optimize helium-ion beam induced deposition of PtC nanopillars with the (CH3)3Pt(CPCH3) precursor. The beam current, beam dwell time, precursor refresh time, and beam focus have been independently varied. Continuous beam exposure resulted in narrow but short pillars, while...journal article 2011
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Van Heel, D.D. (author), Maas, T. (author), De Gijt, J.G. (author), Said, M. (author)This paper describes quay wall and bridge designs in different materials, which are compared with regard the the CO2-emission and the Life Cycle Analysis (LCA). For this study the requirements and boundary conditions from the Euromax Terminal quay wall, in the Port of Rotterdam, have been used. The preliminary designs of the quay wall (made...conference paper 2011
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Reijneveld, J. (author), Maas, A. (author), Choukroun, D. (author), Kuiper, J.M. (author)Building on previous works, this paper introduces a novel continuous-time stochastic optimal linear quaternion estimator under the assumptions of rate gyro measurements and of vector observations of the attitude. A quaternion observation model, which observation matrix is rank degenerate, is reduced to a two-dimensional model via a maximum...conference paper 2011
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Maas, T. (author), De Gijt, J.G. (author), Van Heel, D.D. (author)In this paper quay wall designs in different materials are compared with regard to the CO2-emission and the Life Cycle Analysis (LCA). For this study the requirements and boundary conditions of the quay wall in the Euromax Terminal, the Port of Rotterdam, have been used. An overview of preliminary designs of the tender phase with a concrete...conference paper 2011
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Maas, D. (author), Van veldhoven, E. (author), Chen, P. (author), Sidorkin, V. (author), Salemink, H. (author), Van der Drift, E. (author), Alkemade, P. (author)The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well...conference paper 2010
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Veling, E.J.M. (author), Maas, C. (author)In this paper we comment on some recent numerical and analytical work to evaluate the Hantush Well Function. We correct an expression found in a Comment by Nadarajah (J. of Hydrology, vol. 338, p. 152-153 (2007)) to a paper by Prodanoff et al. (J. of Hydrology, vol. 318, p. 173-183 (2006)). We subsequently derived another analytic representation...journal article 2010
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Alkemade, P.F.A. (author), Chen, P. (author), Van Veldhoven, E. (author), Maas, D. (author)An analytical model for the growth of nanopillars by helium ion-beam-induced deposition is presented and compared to experimental data. This model describes the competition between pillar growth in vertical and lateral directions. It assumes that vertical growth is induced by incident primary ions and type-1 secondary electrons, whereas lateral...journal article 2010
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Chen, P. (author), Van Veldhoven, E. (author), Sanford, C.A. (author), Salemink, H.W.M. (author), Maas, D.J. (author), Smith, D.A. (author), Rack, P.D. (author), Alkemade, P.F.A. (author)A 25 keV focused helium ion beam has been used to grow PtC nanopillars on a silicon substrate by beam-induced decomposition of a (CH3)3Pt(CPCH3) precursor gas. The ion beam diameter was about 1 nm. The observed relatively high growth rates suggest that electronic excitation is the dominant mechanism in helium ion-beam-induced deposition. Pillars...journal article 2010
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- Van Veldhoven, E. (author), Sidorkin, V. (author), Chen, P. (author), Alkemade, P. (author), Van der Drift, E. (author), Salemink, H. (author), Zandbergen, H. (author), Maas, D. (author) journal article 2010
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Van der Laan, D.J. (author), Schaart, D.R. (author), Maas, M.C. (author), Beekman, F.J. (author), Bruyndonckx, P. (author), Van Eijk, C.W.E. (author)Much research is being conducted on position-sensitive scintillation detectors for medical imaging, particularly for emission tomography. Monte Carlo simulations play an essential role in many of these research activities. As the scintillation process, the transport of scintillation photons through the crystal(s), and the conversion of these...journal article 2010
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- Maas, S.L. (author) master thesis 2010
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- Maas, S.L. (author) master thesis 2010
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- Maas, S.L. (author) report 2010
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- Maas, S.L. (author) master thesis 2010
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- Maas, S.L. (author) report 2010
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- Maas, S.L. (author) report 2010
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Castaldo, V. (author), Hagen, C.W. (author), Kruit, P. (author), Van Veldhoven, E. (author), Maas, D. (author)The determination of the quality of an imaging system is not an easy task for, in general, at least three parameters, strictly interdependent, concur in defining it: resolution, contrast, and signal-to-noise ratio. The definition of resolution itself in scanning microscopy is elusive and the case of scanning ion microscopy is complicated by the...journal article 2009
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Sanford, C.A. (author), Stern, L. (author), Barriss, L. (author), Farkas, L. (author), DiManna, M. (author), Mello, R. (author), Maas, D.J. (author), Alkemade, P.F.A. (author)Helium ion microscopy is now a demonstrated practical technology that possesses the resolution and beam currents necessary to perform nanofabrication tasks, such as circuit edit applications. Due to helium’s electrical properties and sample interaction characteristics relative to gallium, it is likely that the properties and deposition...journal article 2009
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Sidorkin, V. (author), Van Veldhoven, E. (author), Van der Drift, E.W.J.M. (author), Alkemade, P.F.A. (author), Salemink, H. (author), Maas, D. (author)Scanning helium ion beam lithography is presented as a promising pattern definition technique for dense sub-10-nm structures. The powerful performance in terms of high resolution, high sensitivity, and a low proximity effect is demonstrated in a hydrogen silsesquioxane resist.journal article 2009
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Maas, D. (author), Van Veldhoven, E. (author), Chen, P. (author), Sidorkin, V. (author), Salemink, H. (author), Van der Drift, E. (author), Alkemade, P. (author)The recently introduced helium ion microscope (HIM) is capable of imaging and fabrication of nanostructures thanks to its sub-nanometer sized ion probe [1,2]. The unique interaction of the helium ions with the sample material provides very localized secondary electron emission, thus providing a valuable signal for high-resolution imaging as well...conference paper 2009