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Pouyan, P. (author), Amat, Esteve (author), Hamdioui, S. (author), Rubio, Antonio (author)Emerging technologies such as RRAMs are attracting significant attention, due to their tempting characteristics such as high scalability, CMOS compatibility and non-volatility to replace the current conventional memories. However, critical causes of hardware reliability failures (such as process variation due to their nano-scale structure) have...conference paper 2016