Automatic defect identification during RRAM characterization

Resistive random access memory (RRAM) is an emerging memory technology that has the potential to replace dynamic random access memory (DRAM) or FLASH. The current memory technology suffer from scalability issues. RRAM can be used as potential replacement for Flash and DRAM. RRAM stores information using resistance states instead of charge. RRAM...

A defect-based physics-informed machine learning framework for fatigue finite life prediction in additive manufacturing

Defects in additively manufactured materials are one of the leading sources of uncertainty in mechanical fatigue. Fracture mechanics concepts are useful to evaluate their influence, nevertheless, these approaches cannot account for the real morphology of defects. Preliminary attempts to exploit a more comprehensive description of defects can...