Huefner, M. (author), May, C. (author), Ki?in, S. (author), Ensslin, K. (author), Ihn, T. (author), Hilke, M. (author), Suter, K. (author), De Rooij, N.F. (author), Staufer, U. (author) We present measurements on a superconducting single-electron transistor (SET) in which the metallic tip of a low-temperature scanning force microscope is used as a movable gate. We characterize the SET through charge stability diagram measurements and compare them to scanning gate measurements taken in the normal conducting and the...
journal article 2009