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Sun, B. (author), Fan, J. (author), Fan, Xuejun (author), Zhang, Kouchi (author)This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe...conference paper 2018
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Sun, B. (author), Fan, Xuejun (author), Fan, J. (author), Zhang, Kouchi (author), Qian, Cheng (author)In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation...conference paper 2017