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Aziza, H. (author), Postel-Pellerin, J. (author), Fieback, M. (author), Hamdioui, S. (author), Xun, H. (author), Taouil, M. (author), Coulie, K. (author), Rahajandraibe, W. (author)
While Resistive RRAM (RRAM) offers attractive features for artificial neural networks (NN) such as low power operation and high-density, its conductance variation can pose significant challenges when the storage of synaptic weights is concerned. This paper reports an experimental evaluation of the conductance variations of manufactured RRAMs...
conference paper 2024
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Pouyan, P. (author), Amat, Esteve (author), Hamdioui, S. (author), Rubio, Antonio (author)
Emerging technologies such as RRAMs are attracting significant attention, due to their tempting characteristics such as high scalability, CMOS compatibility and non-volatility to replace the current conventional memories. However, critical causes of hardware reliability failures (such as process variation due to their nano-scale structure) have...
conference paper 2016