Searched for: author:"Bijster, R.J.F."
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Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
Optical near-field technologies such as solid immersion lenses and hyperlenses are candidate solutions for high resolution and high throughput wafer inspection and metrology for the next technology nodes. Besides sub-diffraction limited optical performance, these concepts share the necessity of extreme proximity to the sample at distances that...
conference paper 2016
document
Bijster, R.J.F. (author), Herfst, R. (author), Klop, W (author), Hagen, R. (author), Sadeghian Marnani, H. (author)
conference paper 2016
document
Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
abstract 2016
document
Bijster, R.J.F. (author), Klop, W (author), Hagen, R. (author), Sadeghian Marnani, H. (author)
abstract 2016
document
Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
conference paper 2016
document
Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
abstract 2016
Searched for: author:"Bijster, R.J.F."
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