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Romito, A. (author), Gefen, Y. (author), Blanter, Y.M. (author)
We propose a protocol for a controlled experiment to measure a weak value of the electron’s spin in a solid state device. The weak value is obtained by a two step procedure—weak measurement followed by a strong one (postselection), where the outcome of the first measurement is kept provided a second postselected outcome occurs. The setup...
journal article 2008