Searched for: author%3A%22Blanter%2C+Y.M.%22
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Leeuwenhoek, M. (author), Groeblacher, S. (author), Allan, Milan P. (author), Blanter, Y.M. (author)
A double-tip scanning tunneling microscope with nanometer-scale tip separation has the ability to access the single-electron Green's function in real and momentum spaces based on second-order tunneling processes. Experimental realization of such measurements has been limited to quasi-one-dimensional systems due to the extremely small signal...
journal article 2020
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Leeuwenhoek, M. (author), Norte, R.A. (author), Bastiaans, Koen M. (author), Cho, Doohee (author), Battisti, Irene (author), Blanter, Y.M. (author), Groeblacher, S. (author), Allan, Milan P. (author)
We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called smart tips and show the possibility of device-based STM tips. Contrary to conventional etched metal wire...
journal article 2019