Annink, Edian B. (author), Rauwerda, Gerard (author), Hakkennes, Edwin (author), Menicucci, A. (author), Di Mascio, S. (author), Furano, Gianluca (author), Ottavi, Marco (author) Soft errors in embedded systems' memories like single-event upsets and multiple-bit upsets lead to data and instruction corruption. Therefore, devices deployed in harsh environments, such as space, use fault-tolerant processors or redundancy methods to ensure critical application dependability. Another rising concern in secure, critical space...
conference paper 2022