Searched for: author%3A%22Simmons%2C+M.Y.%22
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Miwa, J.A. (author), Mol, J.A. (author), Salfi, J. (author), Rogge, S. (author), Simmons, M.Y. (author)
Single phosphorus donors in silicon are promising candidates as qubits in the solid state. Here, we present low temperature scanning probe microscopy and spectroscopy measurements of individual phosphorus dopants deliberately placed in p-type silicon ?1?nm below the surface. The ability to image individual dopants combined with scanning...
journal article 2013
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Zwanenburg, F.A. (author), Dzurak, A.S. (author), Morello, A. (author), Simmons, M.Y. (author), Hollenberg, L.C.L. (author), Klimeck, G. (author), Rogge, S. (author), Coppersmith, S.N. (author), Eriksson, M.A. (author)
This review describes recent groundbreaking results in Si, Si/SiGe, and dopant-based quantum dots, and it highlights the remarkable advances in Si-based quantum physics that have occurred in the past few years. This progress has been possible thanks to materials development of Si quantum devices, and the physical understanding of quantum effects...
journal article 2013
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Mol, J.A. (author), Salfi, J. (author), Miwa, J.A. (author), Simmons, M.Y. (author), Rogge, S. (author)
Understanding the electronic properties of dopants near an interface is a critical challenge for nanoscale devices. We have determined the effect of dielectric mismatch and quantum confinement on the ionization energy of individual acceptors beneath a hydrogen passivated silicon (100) surface. While dielectric mismatch between the vacuum and the...
journal article 2013