- document
-
Gautsch, D. (author), Parrat, D. (author), De Rooij, N. (author), Staufer, U. (author), Marookian, J.M. (author), Hecht, M. (author), Vijendran, S. (author), Sykulska, H. (author), Pike, T.W. (author)Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.journal article 2011
- document
-
Huefner, M. (author), May, C. (author), Ki?in, S. (author), Ensslin, K. (author), Ihn, T. (author), Hilke, M. (author), Suter, K. (author), De Rooij, N.F. (author), Staufer, U. (author)We present measurements on a superconducting single-electron transistor (SET) in which the metallic tip of a low-temperature scanning force microscope is used as a movable gate. We characterize the SET through charge stability diagram measurements and compare them to scanning gate measurements taken in the normal conducting and the...journal article 2009