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- Onink, M. (author), Brakman, C.M. (author), Root, J.H. (author), Tichelaar, F.D. (author), Mittemeijer, E.J. (author), Van der Zwaag, S. (author) conference paper 1994
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- Onink, M. (author), Tichelaar, F.D. (author), Mittemeijer, E.J. (author), Van der Zwaag, S. (author) conference paper 1995
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- Tichelaar, F.D. (author) doctoral thesis 1990
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Zhang, S. (author), Kwakernaak, C. (author), Tichelaar, F.D. (author), Sloof, W.G. (author), Kuzmina, M. (author), Herbig, M. (author), Raabe, D. (author), Brück, E. (author), Van der Zwaag, S. (author), Van Dijk, N.H. (author)The autonomous repair mechanism of creep cavitation during high-temperature deformation has been investigated in Fe-Au and Fe-Au-B-N alloys. Combined electron-microscopy techniques and atom probe tomography reveal how the improved creep properties result from Au precipitation within the creep cavities, preferentially formed on grain boundaries...journal article 2015
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- Onink, M. (author), Brakman, C.M. (author), Tichelaar, F.D. (author), Mittemeijer, E.J. (author), Van der Zwaag, S. (author), Root, J.H. (author), Konyer, N.B. (author) journal article 1993
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Grachev, S.Y. (author), Tichelaar, F.D. (author), Janssen, G.C.A.M. (author)We studied the tensile stress and grain-width evolution in sputter-deposited Cr films with thickness from 20?nm to 2.7??m. Films were deposited in an industrial Hauzer 750 physical vapor deposition machine at 50–80?°C. The films exhibited a columnar microstructure. A power law behavior of the tensile stress as well as of the average grain width...journal article 2005
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- Wellock, K. (author), Theeuwen, S.J.C.H. (author), Caro, J. (author), Gribov, N.N. (author), Van Gorkom, R.P. (author), Radelaar, S. (author), Tichelaar, F.D. (author), Hickey, B.J. (author), Marrows, C.H. (author) journal article 1999
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Pujada, B.R. (author), Tichelaar, F.D. (author), Arnoldbik, W.M. (author), Sloof, W.G. (author), Janssen, G.C.A.M. (author)Growth stress in tungsten carbide-diamond-like carbon coatings, sputter deposited in a reactive argon/acetylene plasma, has been studied as a function of the acetylene partial pressure. Stress and microstructure have been investigated by wafer curvature and transmission electron microscopy (TEM) whereas composition and energy distribution...journal article 2009
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- Onink, M. (author), Tichelaar, F.D. (author), Brakman, C.M. (author), Mittemeijer, E.J. (author), Van der Zwaag, S. (author) journal article 1996
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He, S.M. (author), Van Dijk, N.H. (author), Paladugu, M. (author), Schut, H. (author), Kohlbrecher, J. (author), Tichelaar, F.D. (author), Van der Zwaag, S. (author)We performed in situ time-resolved small-angle neutron scattering (SANS) measurements on high-purity Fe-Cu and Fe-Cu-B-N alloys during isothermal aging at 550 °C in order to study the potential self-healing of deformation-induced defects by nanosized Cu precipitation. Three different samples with 0%, 8%, and 24% prestrain were used to study the...journal article 2010
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Mele, L. (author), Santagata, F. (author), Panraud, G. (author), Morana, B. (author), Tichelaar, F.D. (author), Creemer, J.F. (author), Sarro, P.M. (author)This paper presents a new process for the fabrication of MEMS-based nanoreactors for in situ atomic-scale imaging of nanoparticles under relevant industrial conditions. The fabrication of the device is completed fully at wafer level in an ISO 5 clean room and it is based on silicon fusion bonding and thin film encapsulation for sealed lateral...journal article 2010
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Pujada, B.R. (author), Tichelaar, F.D. (author), Janssen, G.C.A.M. (author)Tungsten carbide-diamond like carbon (WC-DLC) multilayer coatings have been prepared by sputter deposition from a tungsten-carbide target and periodic switching on and off of the reactive acetylene gas flow. The stress in the resulting WC-DLC multilayers has been studied by substrate curvature. Periodicity and microstructure have been studied by...journal article 2007
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Tran, A.T. (author), Pandraud, G. (author), Tichelaar, F.D. (author), Nguyen, M.D. (author), Schellevis, H. (author), Sarro, P.M. (author)The structure of AlN layers grown on Ti with and without an AlN interlayer between the Si substrate and the Ti layer is investigated. The AlN grains take over the orientation of the Ti columnar grains in both cases. Surprisingly, the Ti grains do not take over completely the orientations of the AlN grains of the interlayer, and show the same...journal article 2013
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Sharma, K. (author), Ponomarev, M.V. (author), Verheijen, M.A. (author), Kunz, O. (author), Tichelaar, F.D. (author), Van de Sanden, M.C.M. (author), Creatore, M. (author)In this paper, we report on the deposition of amorphous silicon (a-Si:H) films at ultra-high growth rate (11–60?nm/s) by means of the expanding thermal plasma technique, followed by solid-phase crystallization (SPC). Large-grain (?1.5??m) polycrystalline silicon was obtained after SPC of high growth rate (?25?nm/s) deposited a-Si:H films. The...journal article 2012
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Tirumalasetty, G.K. (author), Van Huis, M.A. (author), Fang, C.M. (author), Xu, Q. (author), Tichelaar, F.D. (author), Hanlon, D.N. (author), Sietsma, J. (author), Zandbergen, H.W. (author)Multiphase steels utilising composite strengthening may be further strengthened via grain refinement or precipitation by the addition of microalloying elements. In this study a Nb microalloyed steel comprising martensite, bainite and retained austenite has been studied. By means of transmission electron microscopy (TEM), we have investigated the...journal article 2011
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Cheynet, M.C. (author), Pokrant, S. (author), Tichelaar, F.D. (author), Rouvière, J.L. (author)Valence electron energy loss spectroscopy (VEELS) and high resolution transmission electron microscopy (HRTEM) are performed on three different HfO2 thin films grown on Si (001) by chemical vapor deposition (CVD) or atomic layer deposition (ALD). For each sample the band gap (Eg) is determined by low-loss EELS analysis. The Eg values are then...journal article 2007
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Yalcin, A.O. (author), Fan, Z. (author), Goris, B. (author), Li, W.F. (author), Koster, R.S. (author), Fang, C.M. (author), Van Blaaderen, A. (author), Casavola, M. (author), Tichelaar, F.D. (author), Bals, S. (author), Van Tendeloo, G. (author), Vlugt, T.J.H. (author), Vanmaekelbergh, D. (author), Zandbergen, H.W. (author), Van Huis, M.A. (author)Here, we show a novel solid?solid?vapor (SSV) growth mechanism whereby epitaxial growth of heterogeneous semiconductor nanowires takes place by evaporation-induced cation exchange. During heating of PbSe-CdSe nanodumbbells inside a transmission electron microscope (TEM), we observed that PbSe nanocrystals grew epitaxially at the expense of CdSe...journal article 2014
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- Jeurgens, L.P.H. (author), Sloof, W.G. (author), Tichelaar, F.D. (author), Mittemeijer, E.J. (author) journal article 2000
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Kessels, M.J.H. (author), Bijkerk, F. (author), Tichelaar, F.D. (author), Verhoeven, J. (author)We developed and demonstrate an analysis method in which we calibrate the intensity scale of cross-sectional transmission electron microscopy (TEM) using Cu K? reflectometry. This results in quantitative in-depth density profiles of multilayer structures. Only three free parameters are needed to obtain the calibrated profiles, corresponding to...journal article 2005
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Zijlstra, T. (author), Lodewijk, C.F.J. (author), Vercruyssen, N. (author), Tichelaar, F.D. (author), Loudkov, D.N. (author), Klapwijk, T.M. (author)High critical current-density (10?to?420?kA/cm2) superconductor-insulator-superconductor tunnel junctions with aluminum nitride barriers have been realized using a remote nitrogen plasma from an inductively coupled plasma source operated in a pressure range of 10?3–10?1?mbar. We find a much better reproducibility and control compared to previous...journal article 2007