Searched for: author%3A%22Weppelman%2C+I.G.C.%22
(1 - 8 of 8)
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Garming, M.W.H. (author), Weppelman, I.G.C. (author), Lee, M. (author), Stavenga, T. (author), Hoogenboom, J.P. (author)
Ultrafast scanning electron microscopy images carrier dynamics and carrier induced surface voltages using a laser pump electron probe scheme, potentially surpassing all-optical techniques in probe resolution and surface sensitivity. Current implementations have left a four order of magnitude gap between optical pump and electron probe...
journal article 2022
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Weppelman, I.G.C. (author)
This thesis is dedicated to the development of a beam blanker for Ultrafast Electron Microscopy. Ultrafast electron microscopy aims to resolve structural dynamics at the nanometer and (sub) picosecond time scale. In these temporal and spatial scales many important processes in physics, chemistry and biology do occur. Examples of these are the...
doctoral thesis 2021
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Weppelman, I.G.C. (author), Moerland, R.J. (author), Zhang, L (author), Kieft, E. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the source. We have recently presented the concept...
journal article 2019
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Weppelman, I.G.C. (author), Moerland, R.J. (author), Hoogenboom, J.P. (author), Kruit, P. (author)
We present a new method to create ultrashort electron pulses by integrating a photoconductive switch with an electrostatic deflector. This paper discusses the feasibility of such a system by analytical and numerical calculations. We argue that ultrafast electron pulses can be achieved for micrometer scale dimensions of the blanker, which are...
journal article 2018
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Moerland, R.J. (author), Weppelman, I.G.C. (author), Scotuzzi, M. (author), Hoogenboom, J.P. (author)
Many applications in (quantum) nanophotonics rely on controlling light-matter interaction through strong, nanoscale modification of the local density of states (LDOS). All-optical techniques probing emission dynamics in active media are commonly used to measure the LDOS and benchmark experimental performance against theoretical predictions....
journal article 2018
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Garming, M.W.H. (author), Weppelman, I.G.C. (author), De Boer, Pascal (author), Martínez, Felipe Perona (author), Schirhagl, Romana (author), Hoogenboom, J.P. (author), Moerland, R.J. (author)
Nanomaterials can be identified in high-resolution electron microscopy images using spectrally-selective cathodoluminescence. Capabilities for multiplex detection can however be limited, e.g., due to spectral overlap or availability of filters. Also, the available photon flux may be limited due to degradation under electron irradiation. Here,...
journal article 2017
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Moerland, R.J. (author), Weppelman, I.G.C. (author), Garming, M.W.H. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
We show cathodoluminescence-based time-resolved electron beam spectroscopy in order to directly probe the spontaneous emission decay rate that is modified by the local density of states in a nanoscale environment. In contrast to dedicated laser-triggered electron-microscopy setups, we use commercial hardware in a standard SEM, which allows us to...
journal article 2016
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Narvaez, A.C. (author), Weppelman, I.G.C. (author), Moerland, R.J. (author), Liv, N. (author), Zonnevylle, A.C. (author), Kruit, P. (author), Hoogenboom, J.P. (author)
Cathodoluminescence (CL) microscopy is an emerging analysis technique in the fields of biology and photonics, where it is used for the characterization of nanometer sized structures. For these applications, the use of transparent substrates might be highly preferred, but the detection of CL from nanostructures on glass is challenging because of...
journal article 2013
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