Reyes, Nicolás (author), Mayorga, Ivan Cámara (author), Grutzeck, Gerrit (author), Yates, Stephen J.C. (author), Baryshev, Andrey (author), Baselmans, J.J.A. (author), Weiss, Axel (author), Klein, Bernd (author) Characterization of wide-field optics in the Terahertz regime imposes new and demanding requirements for testing systems. Basic optical parameters can be determined from scalar planar characterization, obtained using monochromatic or thermal sources located in the instrument focal plane. In contrast, important features, such as the spillover...
journal article 2023
