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Vos, Y. (author), Lane, R. (author), Peddie, Chris J. (author), Wolters, A.E. (author), Hoogenboom, J.P. (author)
The authors present the application of a retarding field between the electron objective lens and sample in an integrated fluorescence and electron microscope. The retarding field enhances signal collection and signal strength in the electron microscope. This is beneficial for samples prepared for integrated fluorescence and electron...
journal article 2020