Outlook: From Physics of Failure to Physics of Degradation

In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we...

System level reliability assessment for high power light-emitting diode lamp based on a Bayesian network method

The increased system complexity in electronic products brings challenges in a system level reliability assessment and lifetime estimation. Traditionally, the graph model-based reliability block diagrams (RBD) and fault tree analysis (FTA) have been used to assess the reliability of products and systems. However, these methods are based on...

Degradation of optical materials in solid-state lighting systems

In this paper, degradation mechanisms of optical materials, used in the light emitting diode (LED)-based products, are reviewed. The LED lighting is one of the fastest technology shifts in human history. Lighting accounts for almost 20% of the global electrical energy use, inferring that replacement of traditional lighting sources with LEDs...

Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light-Emitting Diodes

Light-emitting diodes (LEDs) are among the key innovations that have revolutionized the lighting industry, due to their versatility in applications, higher reliability, longer lifetime, and higher efficiency compared with other light sources. The demand for increased lifetime and higher reliability has attracted a significant number of...

A stochastic process based reliability prediction method for LED driver

In this study, we present a general methodology that combines the reliability theory with physics of failure for reliability prediction of an LED driver. More specifically, an integrated LED lamp, which includes an LED light source with statistical distribution of luminous flux, and a driver with a few critical components, is considered. The...

A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation

In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver's degradations on lamp's lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp's...

A Reliability Prediction for Integrated LED Lamp with Electrolytic Capacitor-Free Driver

This paper studies the interaction of catastrophic failure of the driver and LED luminous flux decay for an integrated LED lamp with an electrolytic capacitor-free LED driver. Electronic thermal simulations are utilized to obtain the lamp's dynamic history of temperature and current for two distinct operation modes: constant current mode (CCM...