Nanostep height measurement via spatial mode projection

We demonstrate an optical scheme for measuring the thickness of thin nanolayers with the use of light beam’s spatial modes. The novelty in our scheme is the projection of the beam reflected by the sample onto a properly tailored spatial mode. In the experiment described below, we are able to measure a step height smaller than 10 nm, i.e., one...

Polarization nulling interferometry for exoplanet detection

We introduce a new concept of nulling interferometer without any achromatic device, using polarization properties of light. This type of interferometer should enable a high rejection ratio in a theoretically unlimited spectral band. We analyze several consequences of the proposed design, notably, the possibility of fast internal modulation.

Chromatism compensation in wide-band nulling interferometry for exoplanet detection

We introduce the concept of chromatism compensation in nulling interferometry that enables a high rejection ratio in a wide spectral band. Therefore the achromaticity condition considered in most nulling interferometers can be relaxed. We show that this chromatism compensation cannot be applied to a two-beam nulling interferometer, and we make...

Michelson wide-field stellar interferometry: Principles and experimental verification

A new interferometric technique for Michelson wide-field interferometry is presented that consists of a Michelson pupil-plane combination scheme in which a wide field of view can be achieved in one shot. This technique uses a stair-shaped mirror in the intermediate image plane of each telescope in the array, allowing for simultaneous correction...