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Alfaraj, H.S.A. (author), Brackenhoff, J.A. (author), Wapenaar, C.P.A. (author)
When reflection images are studied, often only the zero-offset reflectivity is considered, however, taking into account the angle-dependent reflectivity can add additional information about the subsurface. This additional information can be used to extract the properties of the subsurface using amplitude variation with offset (AVO) analysis....
conference paper 2020