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Ellis, J.D. (author), Joo, K.N. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
We describe two different, double-sided interferometer designs for measuring material stability. Both designs are balanced interferometers where the only optical path difference is the sample and the reference beams are located within the interferometer. One interferometer is a double-pass design, whereas the other is a single-pass system. Based...
journal article 2009