Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes

We report on the degradation mechanisms and dynamics of silicone encapsulated ultraviolet A (UV-A) high-power light-emitting diodes (LEDs), with a peak wavelength of 365nm. The stress tests were carried out for a period of 8665 hours with forward currents between 350mA and 700mA and junction temperatures up to 132°C. Depending on stress...

Reliability assessment of redundant safety systems with degradation

Reliability of transport equipment plays a crucial role in providing safety for passengers. Safety systems of transport equipment perform safety functions with assigned safety integrity levels (SIL). If the reliability of a safety system is not sufficient, it has to be improved till the required level. This can be done by improving maintenance,...