Method and circuit for determining the wave-length of light

Abstract of US 4749851 (A) Method and system for determining the wave-length of light impinging onto the surface of a light sensitive semiconductor structure by determining the photocurrent therethrough. The semiconductor structure consists of a substrate of one conductivity type, an adjoining epitaxial layer of a second conductivity type, and...

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Method of performing an assay, apparatus therefor, and a method of manufacturing and apparatus

The invention relates to a method of transforming a colour image, wherein for each separate pixel a measured level of lightness, a measured chroma and a measured colour is determined, followed by a predetermined adjustment in the three-dimensional level of lightness, chroma and colour, wherein a. for each separate pixel a direction of adjustment...