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document
Guo, Y. (author)
Electron tomography is a powerful tool in materials science to characterize nanostructures in three dimensions (3D). In scanning transmission electron microscopy (STEM), the sample under study is exposed to a focused electron beam and tilted to obtain twodimensional (2D) projections at different angles; many imaging modes are available such as...
doctoral thesis 2020
document
Guo, Y. (author), Rieger, B. (author)
Regularization has been introduced to electron tomography for enhancing the reconstruction quality. Since over-regularization smears out sharp edges and under-regularization leaves the image too noisy, finding the optimal regularization strength is crucial. To this end, one can either manually tune regularization parameters by trial and error...
conference paper 2019
document
Guo, Y. (author), Aveyard, R.A. (author), Rieger, B. (author)
In this paper, we present a multichannel cross-modal fusion algorithm to combine two complementary modalities in electron tomography: X-ray spectroscopy and scanning transmission electron microscopy (STEM). The former reveals compositions with high elemental specificity but low signal-to-noise ratio (SNR), while the latter characterizes the...
journal article 2019