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Guo, Y. (author)Electron tomography is a powerful tool in materials science to characterize nanostructures in three dimensions (3D). In scanning transmission electron microscopy (STEM), the sample under study is exposed to a focused electron beam and tilted to obtain twodimensional (2D) projections at different angles; many imaging modes are available such as...doctoral thesis 2020
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Guo, Y. (author), Rieger, B. (author)Regularization has been introduced to electron tomography for enhancing the reconstruction quality. Since over-regularization smears out sharp edges and under-regularization leaves the image too noisy, finding the optimal regularization strength is crucial. To this end, one can either manually tune regularization parameters by trial and error...conference paper 2019
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Guo, Y. (author), Aveyard, R.A. (author), Rieger, B. (author)In this paper, we present a multichannel cross-modal fusion algorithm to combine two complementary modalities in electron tomography: X-ray spectroscopy and scanning transmission electron microscopy (STEM). The former reveals compositions with high elemental specificity but low signal-to-noise ratio (SNR), while the latter characterizes the...journal article 2019