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Yuan, S. (author), Zhang, Z. (author), Fieback, M. (author), Xun, H. (author), Marinissen, E. J. (author), Kar, G. S. (author), Rao, S. (author), Couet, S. (author), Taouil, M. (author), Hamdioui, S. (author)The development of Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) mass production requires high-quality test solutions. Accurate and appropriate fault modeling is crucial for the realization of such solutions. This paper targets fault modeling and test generation for all interconnect and contact defects in STT-MRAMs and shows that using the...conference paper 2023
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Yuan, S. (author), Taouil, M. (author), Fieback, M. (author), Xun, H. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Rao, Sidharth (author), Couet, Sebastien (author), Hamdioui, S. (author)The development of Spin-transfer torque magnetic RAM (STT-MRAM) mass production requires high-quality dedicated test solutions, for which understanding and modeling of manufacturing defects of the magnetic tunnel junction (MTJ) is crucial. This paper introduces and characterizes a new defect called Back-Hopping (BH); it also provides its...conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Zhang, Ziwei (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memory (RRAM) is a potential technology to replace conventional memories by providing low power consumption and high-density storage. As various manufacturing vendors make significant efforts to push it to high-volume production and commercialization, high-quality and efficient test solutions are of great importance. This...conference paper 2023
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Fieback, M. (author), Bradarić, Filip (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memory (RRAM, or ReRAM) is a promising memory technology to replace Flash because of its low power consumption, high storage density, and simple integration in existing IC production processes. This has motivated many companies to invest in this technology. However, RRAM manufacturing introduces new failure mechanisms and...conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Aziza, Hassen (author), Heidekamp, Mathijs (author), Copetti, Thiago (author), Poehls, Leticia Bolzani (author), Taouil, M. (author), Hamdioui, S. (author)Resistive Random Access Memories (RRAMs) are being commercialized with significant investment from several semiconductor companies. In order to provide efficient and high-quality test solutions to push high-volume production, a comprehensive understanding of manufacturing defects is significantly required. This paper identifies and characterizes...conference paper 2023
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Aouichi, A. (author), Yuan, S. (author), Fieback, M. (author), Rao, Siddharth (author), Kim, Woojin (author), Marinissen, Erik Jan (author), Couet, Sebastien (author), Taouil, M. (author), Hamdioui, S. (author)Spin-Transfer Torque Magnetic RAMs (STT-MRAMs) are on their way to commercialization. However, obtaining high-quality test and diagnosis solutions for STT-MRAMs is challenging due to the existence of unique defects in Magnetic Tunneling Junctions (MTJs). Recently, the Device-Aware Test (DA-Test) method has been put forward as an effective...conference paper 2023
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Masoumian, S. (author), Maes, Roel (author), Wang, Rui (author), Yerriswamy, Karthik Keni (author), Schrijen, Geert-Jan (author), Hamdioui, S. (author), Taouil, M. (author)SRAM Physical Unclonable Functions (PUFs) are one of the popular forms of PUFs that can be used to generate unique identifiers and randomness for security purposes. Hence, their resilience to attacks is crucial. The probability of attacks increases when the SRAM PUF start-up values follow a predictable pattern which we refer to as bias. In this...conference paper 2023
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Gomony, Manil Dev (author), Gebregiorgis, A.B. (author), Fieback, M. (author), Geilen, Marc (author), Stuijk, Sander (author), Richter-Brockmann, Jan (author), Bishnoi, R.K. (author), Taouil, M. (author), Hamdioui, S. (author)This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these...conference paper 2023
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Xun, H. (author), Yuan, S. (author), Fieback, M. (author), Taouil, M. (author), Hamdioui, S. (author), Aziza, Hassen (author)Many companies are heavily investing in the commercialization of Resistive Random Access Memories (RRAMs). This calls for a comprehensive understanding of manufacturing defects to develop efficient and high-quality test and diagnosis solutions to push high-volume production. This paper identifies and characterizes a new defect based on silicon...conference paper 2023
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Siddiqi, M.A. (author), Hernández, Jan Andrés Galvan (author), Gebregiorgis, A.B. (author), Bishnoi, R.K. (author), Strydis, C. (author), Hamdioui, S. (author), Taouil, M. (author)Next-generation personalized healthcare devices are undergoing extreme miniaturization in order to improve user acceptability. However, such developments make it difficult to incorporate cryptographic primitives using available target tech-nologies since these algorithms are notorious for their energy consumption. Besides, strengthening these...conference paper 2023
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Aljuffri, A.A.M. (author), Saxena, Mudit (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)Security is one of the most important features that a system must provide. Depending on the application of the target device, different threats should be considered at design time. However, the attack space is vast. Hence, it is difficult to decide what components to protect, what level of protection they require and how efficient they are in...conference paper 2023
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Aljuffri, A.A.M. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author), Sepulveda, Johanna (author)Currently NIST is working towards the standardization of lightweight cryptography (LWC). Although the cryptanalytic strength of LWC is currently under deep scrutiny, the LWC implementation security has not been yet widely explored. GIFT block cipher is the main building block of many of the LWC NIST candidates and therefore has the potential to...conference paper 2022
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Cem Gursoy, Cemil (author), Kraak, D.H.P. (author), Ahmed, Foisal (author), Taouil, M. (author), Jenihhin, Maksim (author), Hamdioui, S. (author)Memory designs require timing margins to compensate for aging and fabrication process variations. With technology downscaling, aging mechanisms became more apparent, and larger margins are considered necessary. This, in return, means a larger area requirement and lower performance for the memory. Bias Temperature Instability (BTI) is one of the...conference paper 2022
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Fieback, M. (author), Taouil, M. (author), Hamdioui, S. (author)Testing of Computation-in-Memory (CIM) designs based on emerging non-volatile memory technologies, such as resistive RAM (RRAM), is fundamentally different from testing traditional memories. Such designs allow not only for data storage (i.e., memory configuration) but also for the execution of logical and arithmetic operations (i.e., computing...conference paper 2022
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Masoumian, S. (author), Selimis, Georgios (author), Wang, Rui (author), Schrijen, Geert-Jan (author), Hamdioui, S. (author), Taouil, M. (author)SRAM Physical Unclonable Functions (PUFs) are among other things today commercially used for secure primitives such as key generation and authentication. The quality of the PUFs and hence the security primitives, depends on intrinsic variations which are technology dependent. Therefore, to sustain the commercial usage of PUFs for cutting-edge...conference paper 2022
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Cardoso Medeiros, G. (author), Fieback, M. (author), Gebregiorgis, A.B. (author), Taouil, M. (author), Poehls, L. B. (author), Hamdioui, S. (author)High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memory Diagnosis (HMD) approach that accurately diagnoses faults in the entire memory. Faults are...conference paper 2022
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Köylü, T.C. (author), Caetano Garaffa, L. (author), Reinbrecht, Cezar (author), Zahedi, M.Z. (author), Hamdioui, S. (author), Taouil, M. (author)The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we...conference paper 2022
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Fieback, M. (author), Münch, Christopher (author), Gebregiorgis, A.B. (author), Cardoso Medeiros, G. (author), Taouil, M. (author), Hamdioui, S. (author), Tahoori, Mehdi (author)Emerging non-volatile resistive memories like Spin-Transfer Torque Magnetic Random Access Memory (STT-MRAM) and Resistive RAM (RRAM) are in the focus of today’s research. They offer promising alternative computing architectures such as computation-in-memory (CiM) to reduce the transfer overhead between CPU and memory, usually referred to as the...conference paper 2022
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Köylü, T.C. (author), Hamdioui, S. (author), Taouil, M. (author)Artificial neural networks (ANNs) are used to accomplish a variety of tasks, including safety critical ones. Hence, it is important to protect them against faults that can influence decisions during operation. In this paper, we propose smart and low-cost redundancy schemes that protect the most vulnerable ANN parts against fault attacks....conference paper 2022
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Köylü, T.C. (author), Fieback, M. (author), Hamdioui, S. (author), Taouil, M. (author)Fault injection attacks pose an important threat to security-sensitive applications, such as secure communication and storage. By injecting faults into instructions, an attacker can cause information leakage or denial-of-service. Hence, it is important to secure the sensitive parts not only by detecting faults in the executed instructions but...conference paper 2022