A study of graphene nanoribbon-based gate performance robustness under temperature variations

As CMOS scaling is reaching its limits, high power density and leakage, low reliability, and increasing IC production costs are prompting for developing new materials, devices, architectures, and computation paradigms. Additionally, temperature variations have a significant impact on devices and circuits reliability and performance. Graphene...

Reliability Aware Computing Platforms Design and Lifetime Management

Aggressive CMOS technology feature size down-scaling into the deca nanometer regime, while benefiting performance and yield, determined device characteristics variability increase w.r.t. their nominal values, which can lead to large spreads in delay, power, and robustness, and make devices more prone to aging and noise induced failures during in...